Etest Systems Ltd. Teradyne ATE and ICT Applications for 18xx and Spectrum 885x In Circuit Testers. We support (amongst others): Z1800 Z1820 Z1860 1880 1884 1888 Agilent 3070 HP3070 muxed i3070 umuxed 1890 8850 8852 8855 and Innovate In-Circuit Test software. Test Fixture and bed of nails hardware supplied. Training courses arranged
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Board test facilities Flying Probe Test (FPT) ICT and
Functional o Allow us to become your test department o Full test, diagnose and repair facilities, or just test and report pass/fail status · Flying Probe Test (FPT) turnkey packages for Takaya series testers o Flying probe test removes the need for expensive test fixturing o Ideal for low to medium production volumes, pre-production and prototype runs ·
ICT turnkey packages for:- o
Teradyne 18xx and Spectrum platforms o
Agilent HP3070 and i3070 platforms o Takaya
Flying Probe Test (FPT) series testers o
Innovate series testers o
Zehntel 8xx series testers o
Cross platform translations and re-engineered programs o
Other tester platforms considered, dependant on requirements ·
ICT/ functional hybrid test solutions o
Using the ICT tester to perform functional type tests with or
without additional test hardware such as IEEE or custom made equipment
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Custom training courses o
For any specific application o
Standard generic training courses ·
All specialist support applications provided. o
Can be supplied in a new program or retro added to an existing
program. o
Custom vector models or modified from existing libraries o
Boundary scan BICT, VICT and VIT vectors
Fast turn around times for turnkey solutions, without last
minute late delivery excuses! o
4 weeks standard turn around normally quoted o
2 weeks achievable if required. ·
Cost effective quoting o
We strive to always provide your lowest quoted price o
Etest’s absolute top quality product at our competitors low
quality prices ·
Unique Etest after sales service and warranty scheme o
Free telephone support o
Free on-site support if Etest code found to be deficient o
Full manufacturers fixture warranty on turn-key solutions ·
Standard program features supplied by Etest o
XIF crystal oscillation test o
Full and complete coverage reports o
Full Parametrics stability analysis run on every program before
delivery o
Full quality audit performed on every program before delivery to
ensure top coverage has been achieved and all components are included in the
test program ·
Wide range of options available on any program to suit all
coverage requirements o
All ‘specialist’ support applications as listed above o
All Multiscan configurations supported (Deltascan, FS+, Capscan,
etc) o
LED colour checking o
Solenoid or pneumatic actuator based switch testing o
Any other customer requirements ·
Wide range of source data acceptable, can generate fixture
and/or program from:- o
Basic data such as circuit diagram and bare board or gerbers o
Can use wide range of latest CAD system outputs, if available ·
Can provide testability reports for a given project o
Useful to determine test coverage before committing to an
expensive ICT project o
Can be used to improve test coverage if the PCB and circuit design
is not frozen ·
Can provide consultancy service o
On or off site o
Improve test coverage in existing programs o
Improve test stability in existing programs o
Improve general test quality in existing programs o
Discuss new project testability issues |
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